Holzapfel B., Hanisch J., Schultz L., Huhne R., Fahler S., Rellinghaus B., Sparing M., Reich E., Gottschall T.
Ключевые слова: HTS, YBCO, nanocomposites, nanoscaled effects, thin films, substrate SrTiO3, PLD process, gas treatments, fabrication, distribution, nanoparticles, size effect, oxygenation treatments, X-ray diffraction, microstructure, heterostructures, pinning force, critical caracteristics, critical current density, angular dependence, experimental results
Ключевые слова: HTS, coated conductors, grain boundaries, PLD process, substrate Ni-W, YBCO, RABITS process, magnetic field distribution, critical caracteristics, angular dependence, transport currents, magnetic field dependence, IBAD process, chemical solution deposition, comparison, microstructure
Holzapfel B., Hanisch J., Schultz L., Huhne R., MacManus-Driscoll J.L., Nast R., Tendeloo G.V., Bianchetti M., Pahlke P., Meledin A., Sieger M., Opherden L.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, nanodoping, nanoscaled effects, pinning force, microstructure, resistive transition, critical caracteristics, Jc/B curves, critical current density, angular dependence, n-value, temperature dependence, magnetic field dependence, experimental results
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Huhne R., Usoskin A., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Stromer J.
Ключевые слова: HTS, coated conductors, buffer layers, fabrication, acoustic emission, surface, precursors, substrate Ni-W, new
Hanisch J., Schultz L., Huhne R., Usoskin A., Pahlke P., Sieger M., Stromer J., Chekhonin P., Skrotzki W.
Ключевые слова: HTS, YBCO, films, PLD process, RABITS process, substrate Ni-W, IBAD process, stainless steel, buffer layers, microstructure, measurement technique
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Huhne R., Nast R., Tendeloo G.V., Bianchetti M., Sparing M., Pahlke P., Lao M., Meledin A., Sieger M., MacManus-Driscoll J.
Holzapfel B., Hanisch J., Schultz L., Huhne R., Nast R., Iida K., Sparing M., Reich E., Gaitzsch U., Pahlke P., Sieger M.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, doping effect, PLD process, RABITS process, nanodoping, nanoscaled effects, microstructure, texture, lattice parameter, composition, microstructure, critical caracteristics, Jc/B curves, pinning force, critical temperature, irreversibility fields, experimental results
Eisterer M., Holzapfel B., Schultz L., Huhne R., Usoskin A., Pahlke P., Lao M., Hering M., Siegert M., Stromer J.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, critical caracteristics, PLD process, microstructure, X-ray diffraction, lattice parameter, thickness dependence, texture, critical temperature, critical current density, substrate stainless steel, fabrication, experimental results
Holzapfel B., Hanisch J., Schultz L., Huhne R., Tendeloo G.V., Freudenberg T., Erbe M., Kirchner A., Molina-Luna L., Damm C., Kaskel S.
Ключевые слова: HTS, YBCO, buffer layers, stability, PLD process, MOD process, substrate LaAlO3, thin films, microstructure
Hanisch J., Schultz L., Huhne R., Usoskin A., Pahlke P., Sieger M., Stromer J., Chekhonin P., Skrotzki W.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, IBAD process, RABITS process, comparison, PLD process, microstructure, local distribution, texture
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, PLD process, doping effect, nanoscaled effects, critical temperature, microstructure, fabrication, X-ray diffraction
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